By Andreas Kerber, Eduard Cartier (auth.), Tibor Grasser (eds.)

This e-book presents a single-source connection with one of many tougher reliability matters plaguing smooth semiconductor applied sciences, unfavourable bias temperature instability. Readers will make the most of state-of-the paintings insurance of study in issues reminiscent of time established disorder spectroscopy, anomalous illness habit, stochastic modeling with extra metastable states, multiphonon conception, compact modeling with RC ladders and implications on machine reliability and lifetime.

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