Advances in layout tools and strategy applied sciences have ended in a continuing bring up within the complexity of built-in circuits (ICs). in spite of the fact that, the elevated complexity and nanometer-size positive aspects of contemporary ICs cause them to at risk of production defects, in addition to functionality and caliber concerns. Testing for Small-Delay Defects in Nanoscale CMOS built-in Circuits covers universal difficulties in components reminiscent of strategy diversifications, energy offer noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The publication additionally addresses checking out for small-delay defects (SDDs), which may reason speedy timing disasters on either serious and non-critical paths within the circuit.
- Overviews semiconductor try demanding situations and the necessity for SDD trying out, together with uncomplicated innovations and introductory fabric
- Describes algorithmic options integrated in advertisement instruments from Mentor Graphics
- Reviews SDD checking out in response to "alternative tools" that explores new metrics, top-off ATPG, and circuit topology-based solutions
- Highlights the benefits and downsides of a various set of metrics, and identifies scope for improvement
Written from the triple point of view of college researchers, EDA device builders, and chip designers and power clients, this publication is the 1st of its sort to handle all features of SDD trying out from one of these assorted standpoint. The ebook is designed as a one-stop reference for present commercial practices, learn demanding situations within the area of SDD trying out, and up to date advancements in SDD solutions.
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